Four-dimensional scanning transmission electron microscopy (4D-STEM) is a spatially resolved electron diffraction technique that records the electron scattering distribution at each point of the electron beam raster, thereby producing a four-dimensional dataset. This second installment of this series presents applications of 4D-STEM, including measurements of crystal orientation and phase, short- and medium-range order, and internal electromagnetic fields.

This content is only available as a PDF.
You do not currently have access to this content.